Discover the world of Scanning Acoustic Microscopy

The unique characteristic of Scanning Acoustic Microscopy is its ability to non-destructively examine the interior of opaque materials with the resolution of optical light microscopy. New ways of thinking and visionary ideas are behind our successful concepts of trend-setting scanning acoustic microscopy technologies.

In almost all fields of modern science and technology the demands for innovative, advanced solutions for non-destructive imaging with scanning acoustic microscopy have increased. PVA TePla Analytical Systems develops, produces and delivers scanning acoustic microscopes. Our unique transducers with frequencies from 3 to 2000 MHz extend imaging and analytical resolution beyond previously achievable limits.

PVA Tepla Analytical Systems GmbH works successfully on the development and production of next generation scanning acoustic microscopes.

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News

07/25/16
Metro4-3D
We are privileged to be part of the European joint project, Metro4-3D (Metrology for future 3D-technologies) which aims to maintain a strong position in the metrology area for semiconductor industry. PVA TePla Analytical Systems GmbH’s main objective on this joint project is to detect internal defects in the BEOL layers, Through-Si Vias (TSV’s) and micro-bumps as well as voids or cracks in stacked dies and wafers using a GHz Scanning Acoustic Microscope. To learn more about Metro4-3D, go to http://metro4-3d.eu/index.php
04/11/16
Top news for 2016
We are pleased to announce some latest developments and innovations we have achieved for the world of Scanning Acoustic Microscopy. 1) Next generation of scanning systems: single gantry linear drives, dual gantry linear drives, new intelligent linear motion Z-axis system. 2) New high-performance digitizers up to 7 GSPS for high performance SAM analysis and imaging. 3) New thin film transducers with customized design 85 MHz-2000 MHz. 4) Next generation of failure analysis SAMs with pulse echo and tone burst excitation modes. 5) New features in our WINSAM 8 graphical user interface W10/ 64 bit. 6) New GHz scanning systems combined with optical top table microscopes and inverted microscopes.