PVA TePla Analytical Systems GmbH
Industrial application
Semiconductor application
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Application of Scanning Acoustic Microscopes Application of Scanning Acoustic Microscopes Application of Scanning Acoustic Microscopes
Micro cracks in the buffer
layer of a ball bearing.
Delamination inside the die-structure
of an integrated circuit.		 Acoustic image of the interface
area between enamel and
dentine of a human tooth.
Application of Scanning Acoustic Microscopes Application of Scanning Acoustic Microscopes Application of Scanning Acoustic Microscopes
Grain structure
of an AlMg-alloy. 		Acoustic image of bumps
on a flip-chipstructure.		 Acoustic image of a
cortical bone structure.
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