PVA TePla Analytical Systems GmbH
Customized automated solutions for inline process diagnostic and control
Transducers
Electronics
Stages
Software
Automation
inline inspection from 2" - 12"

Clean room compatibility down to class 10

Integrated data analysis and automation software, fab communication by SECS interface

Twin or Quad Scanner for highest throughput

Arrays of 2 or more transducers for simultaneous image acquisition

Fast data acquisition by master/slave computer configuration, enabling of transducer arrays for maximum throughput

automation solutions for acoustic microscopy automation solutions for acoustic microscopy
Wafer inspection station for
wafer handling in water
High speed robot for
wafers up to 300 mm
automation solutions for acoustic microscopy automation solutions for acoustic microscopy
Pre-aligner and bar code
reader
Twin scanner with two
transducers

Products
Components
Principle
Application
Publication