PVA TePla Analytical Systems GmbH
B - scan mode and its application
Properties
Operation Principle
Frequency
Resolution
Imaging Modes
A - scan
B - scan
P - scan
C - scan
X - scan
G - scan
D - scan
Z - scan
S - scan
B-scan - the scanner is moving in a desired direction to get either a cross section image in X or Y direction. The depth of different structures can be measured.
Application of Scanning Acoustic Microscopes
B - scan

Application of Scanning Acoustic Microscopes
Cross section image
of the IC sample

Products
Components
Principle
Application
Publication