PVA TePla Analytical Systems GmbH
C - scan mode and its application
Properties
Operation Principle
Frequency
Resolution
Imaging Modes
A - scan
B - scan
P - scan
C - scan
X - scan
G - scan
D - scan
Z - scan
S - scan
C-scan - moves the scanner in a meander pattern over the sample, depending on the set of instrument parameters. The image is composed line by line.
Application of Scanning Acoustic Microscopes
C - scan

Application of Scanning Acoustic Microscopes
C-scan of the IC sample. Delaminated areas are shown in red (phase inversion indicator)

Products
Components
Principle
Application
Publication