PVA TePla Analytical Systems GmbH
G - scan mode and its application
Properties
Operation Principle
Frequency
Resolution
Imaging Modes
A - scan
B - scan
P - scan
C - scan
X - scan
G - scan
D - scan
Z - scan
S - scan
G-scan - produces multiple images depending on selected instrument parameter settings. Different settings can be stored for automatic evaluation.

Application of Scanning Acoustic Microscopes
G - scan

Application of Scanning Acoustic Microscopes
Different depth information
of the IC sample

Products
Components
Principle
Application
Publication