| 1984-1990 |
Development of first ultra high frequency scanning acoustic microscope "Elsam" at company Ernst Leitz,
Wetzlar (Leica), first system operates up to 2 GHz |
| 1991 |
First solutions for V(z), V(f) measurements |
| 1994 |
Foundation of Kraemer Scientific Instruments GmbH in Herborn, continuation of Leica activities in scanning acoustic microscopy |
| 1998 |
First sapphire transducer for detection of Rayleigh waves based on ZnO piezo layers, designed from
100 MHz - 2 GHz |
| 2004 |
Foundation of SAMTEC GmbH Aalen as supplier for in line inspection SAM technology |
| 2005 |
Patent application DE 102006005449 A1 2006.10.12 acoustic auto focus |
| 2005 |
Patent application DE 102006005448 A1 2006.10.12 for multi channel transducer arrays |
| 2005 |
Patent application DE 102006032431 A 12007.12.27 for pinhole detection in Si ingots |
| 2007 |
PVA TePla AG Wettenberg took over all shares of Kraemer Scientific Instruments GmbH Herborn and
SAMTEC GmbH Aalen |
| 2007 |
Merger of Kraemer Scientific Instruments GmbH Herborn and SAMTEC GmbH Aalen to
PVA TePla Analytical Instruments GmbH Aalen |
| 2009 |
First fully automated 8”/12”-bridge tool (4 channel system) for wafer inspection |
| 2009 |
Introduction of fully 3d analytical defect review tool, introduction of HILBERT modules for resolution and
contrast enhancement of SAM images |
| 2009 |
Introduction of SAMnalysis software of add line and off line analysis of SAM data. |
