PVA TePla Analytical Systems GmbH
Publications about different applications with scanning acoustic microscopes
SAM Overview Industrial application Semiconductor Life science
Operation principle Crack growth in ceramic Electronic devices (I) Bone studies
Material Specifications
 Chrome surface Electronic devices (II) Cell cultures
Composite materials Flip chip inspection Thrombus formation
Copolymere plastics IC inspection Tooth enamel
Cracks in hard metals Chips bonded on substrate
Cracks in rock Wafer evaluation
Compound materials Polished and bonded wafer
Fatique cracks
Industrial application Food container
Splice in a fibre optic Glas fibre composites
Stone investigations Lacquer on synthetic mat
Structure of steel Metal alloy
Wire and cable Paint sample
Plastic components
Rubber
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