PVA TePla Analytical Systems GmbH
Publications about different applications with scanning acoustic microscopes
SAM Overview Industrial application Semiconductor Life science
Operation principle Crack growth in ceramic Electronic devices (I) Bone studies
Material Specifications
 Chrome surface Electronic devices (II) Cell cultures
Composite materials Flip chip inspection Thrombus formation
Copolymere plastics IC inspection Tooth enamel
Cracks in hard metals Chips bonded on substrate
Cracks in rock Wafer evaluation
Compound materials Polished and bonded wafer
Fatique cracks Comp. Failure Analysis *
Methodical application Food container Classification of flip-chip contacts *
Comprehensive Failure Analysis * Glas fibre composites Failure diagnostics for 3D system *
Lacquer on synthetic mat
Metal alloy
Paint sample
Plastic components
Rubber
Splice in a fibre optic
Stone investigations
Structure of steel
Wire and cable
* latest Publications
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